Unpowered SSD data retention test shows promising results after six years — results show no data corruption on USB sticks, challenging conventional wisdom

A tech blogger conducted a six-year unpowered SSD data retention test on USB sticks, challenging the belief that NAND flash memory is prone to quick failure. The test involved storing data on USB drives and checking for data integrity over time, with promising results showing no data corruption so far. While some limitations in the methodology were noted, the findings suggest that drive make and storage conditions may play significant roles in data longevity. The study highlights the importance of using high-quality drives from reputable manufacturers and maintaining optimal storage conditions for long-term data retention.