Configuring and Controlling Complex Test Equipment Setups for Silicon Device Test and Characterization
The article discusses techniques for testing analog and mixed-signal devices using reconfigurable setups. Engineers face challenges in validating performance and edge cases with complex semiconductor devices. Test setups may involve various instruments like oscilloscopes and waveform generators, requiring efficient configurations. Multi-channel setups can aid in scalability and performance. Key learnings include reducing signal path complexity, improving data fidelity, building parallel test setups, and configuring example setups for semiconductor validation tests.
IEEE Spectrum•