Semiconductor Supply Chain Security Using Side-Channel Power Measurements and Generative Adversarial Networks (Cornell)

Researchers at Cornell University published a technical paper titled "Out-of-Band Power Side-Channel Detection for Semiconductor Supply Chain Integrity at Scale." The paper discusses a non-destructive screening method that utilizes power side-channel measurements and generative modeling to detect tampering in commodity microcontrollers without trusted hardware. By collecting differential power analysis traces and training a generative adversarial network on benign measurements, they demonstrate the detection of tampering scenarios. This technique could serve as an intermediate screening tier between basic functional tests and high-cost forensic analysis in the semiconductor supply chain.