Scalable End-To-End Test Solutions For Today’s Complex SoCs

The article discusses the need for scalable and efficient end-to-end test solutions for complex System on Chip (SoC) devices. It highlights real-world cases using Synopsys Test products, including shifting left of Design for Test (DFT) for early validation, scalable test solutions from manufacturing to field deployment, enabling system-level tests on Google mobile processors, and in-field debug and repair on AWS custom AI chips. Challenges in testing modern AI and HPC chips, requirements for complete test solutions, and the importance of advanced fault models and compression techniques are also addressed. The article emphasizes the importance of comprehensive test solutions to ensure long-term reliability for mission-critical applications.