Improving Yield Through Shared Data

The article discusses the importance of sharing test, manufacturing, and design data to improve yield in semiconductor manufacturing. With the increasing complexity of advanced packaging and multi-die assemblies, sharing data that was previously siloed by chipmakers, fabs, and OSATs is crucial. Jayant D’Souza from Siemens EDA explains the drivers for data sharing, the need for secure sharing methods, and why this practice is gaining more attention in the industry.