Expanding The Scope Of Testing In Complex Systems

The article discusses the importance of expanding testing in complex systems, such as semiconductor devices in hyperscale data centers and automotive platforms. Traditional testing methods focus on pre-shipment stages, but fail to address issues that arise during operation, leading to downtime and other consequences. In-Field Test is introduced as a solution to enable structural testing in deployed systems, reducing downtime, accelerating root-cause analysis, and maximizing product lifespan. The article also highlights the business and engineering impacts of In-Field Test, such as improving customer experience, lowering logistics costs, and enabling predictive maintenance. Key use cases and implementation considerations are outlined to demonstrate how In-Field Test can shift testing from a static event to a dynamic, data-driven discipline that enhances reliability and economics.