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Enhancing Test Socket Performance Through Application-Specific Validation And System-Level Per-Pin OQC

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SemiEngineering

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The article discusses the importance of enhancing test socket performance through application-specific validation and system-level per-pin Outgoing Quality Control (OQC). Traditional socket design validation methods often fall short in reflecting true application-specific system-level performance, leading to suboptimal socket selection and hidden quality risks for customers. The Modus Test Known Good Socket process, utilizing Modus Performance Tester (MPT) and Modus Test Controller (MTC), allows for validation in an application-specific housing at the system level, enabling accurate monitoring of performance over millions of controlled insertion cycles. By leveraging tools like MPT and MTC for per-pin Current Resistance Extraction System (CRES) measurements, manufacturers can effectively screen out outliers during OQC, ensuring only known good sockets reach the market.

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