Commonality in Correlation Analysis

The article discusses the root causes of low yield in chip manufacturing, which can be attributed to design or process changes. Sometimes, yield issues arise without any changes between manufacturing lots. To identify the cause, data from design, process, and manufacturing must be correlated by factors like date, time, equipment used, manufacturing chamber, and locations of low yield occurrences. Aftkhar Aslam, CEO of yieldWerx, emphasizes the importance of AI/ML in analyzing dozens of process and inspection steps, especially with the added complexity of multi-die assemblies and chiplets in the manufacturing process.