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Aging Aware Steepening Metric for the Fault Coverage of a Test Set (Purdue Univ.)

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SemiEngineering

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Researchers at Purdue University published a technical paper titled "Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set." The paper discusses the importance of in-field testing for detecting hardware defects due to chip aging. It introduces an aging aware steepening metric to enhance fault coverage in stored deterministic scan-based test sets, ensuring effective detection of faults susceptible to aging. The paper demonstrates the effectiveness of this metric through simulations on benchmark circuits. Published in December 2025, the paper offers insights into optimizing test sets for detecting age-related defects.

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